University of Connecticut Releases Paper on Counterfeit Integrated Circuits
April 04, 2014
1-minute read
Counterfeit electronic parts represent a severe and growing risk to the space industry. More than just an economic threat, the use of counterfeit parts in critical applications could have catastrophic results. This paper, developed by the Center for Hardware Assurance, Security and Engineering at the University of Connecticut and published in the Journal of Electronic Testing: Theory and Applications, discusses the dangers of counterfeits and some techniques to identify and avoid them.
Note: This paper is being disseminated for educational and awareness purposes only. It does not reflect NASA endorsement of any kind.